US Patent Issued to AISIN on Oct. 27 for "Specimen analysis apparatus" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. D1,155,847, issued on Oct. 27, was assigned to AISIN Corp. (Kariya, Japan).

"Specimen analysis apparatus" was invented by Yasuaki Nishio (Kariya, Japan) and Ayuto Ike (Kariya, Japan).

The patent was filed on Nov. 6, 2025, under Application No. D/031,634.

*For further information, including images, charts and tables, please visit: http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2=HITOFF&p=1&u=%2Fnetahtml%2FPTO%2Fsearch-bool.html&r=1&f=G&l=50&co1=AND&d=PTXT&s1=D1155847&OS=D1155847&RS=D1155847

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