US Patent Issued to AIER EYE HOSPITAL GROUP on Aug. 25 for "Ophthalmic instrument for measuring optical quality of eye" (Chinese, Spanish Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,714,304, issued on Aug. 25, was assigned to AIER EYE HOSPITAL GROUP Co. LTD (Changsha, China).

"Ophthalmic instrument for measuring optical quality of eye" was invented by Pablo Luis Artal Soriano (Murcia, Spain), Weizhong Lan (Changsha, China), Enrique J Fernandez Martinez (Murcia, Spain), Zhenghua Lin (Changsha, China) and Zhikuan Yang (Changsha, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "An ophthalmic instrument for measuring optical quality of an eye is provided, including: a multi-element eyepiece and a rotatable mirror. A mirror surface of the rotatable mirror is optically conjugated with a first focal plane in an object space of the mul...