US Patent Issued to AGR INTERNATIONAL on Sept. 8 for "Multi-mode thickness measurement device and methods" (Pennsylvania Inventor)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,729,946, issued on Sept. 8, was assigned to AGR INTERNATIONAL INC. (Butler, Pa.).

"Multi-mode thickness measurement device and methods" was invented by Mark F. Zanella Sr. (Chicora, Pa.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A multi-mode thickness measurement device comprises both a magnetic thickness measurement system and a capacitive thickness measurement system at an operative end of the measurement device."

The patent was filed on July 17, 2023, under Application No. 19/099,818.

*For further information, including images, charts and tables, please visit: http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2=HITOFF&p=1&u=%2Fnetahtml%2...