US Patent Issued to AEHR TEST SYSTEMS on March 24 for "Electronics tester" (California Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,584,958, issued on March 24, was assigned to AEHR TEST SYSTEMS (Fremont, Calif.).

"Electronics tester" was invented by Donald P. Richmond II (Palo Alto, Calif.), Jovan Jovanovic (Santa Clara, Calif.) and Scott E. Lindsey (Brentwood, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A tester apparatus is described of the kind having contact with terminals on a wafer for purposes of testing the wafer. A dielectric gas is used to reduce arcing between the contact. A stationary structure and a portable structure have complimentary gas interfaces that engage when the portable structure engages with the stationary structure. A gas box has a channeling bl...