US Patent Issued to ADVANTEST on May 12 for "Testing apparatus, testing method, and computer-readable storage medium" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,176, issued on May 12, was assigned to ADVANTEST Corp. (Tokyo).

"Testing apparatus, testing method, and computer-readable storage medium" was invented by Kotaro Hasegawa (Saitama, Japan) and Koji Miyauchi (Gunma, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a testing apparatus including: a light emission control unit which causes a plurality of light emitting elements to be tested to emit light; a light measurement unit which receives the light emitted from the plurality of light emitting elements and measures wavelengths of the received light; and a determination unit which determines whether there is an abnormality in at least o...