US Patent Issued to ADVANTEST on May 12 for "Electromagnetic wave measuring apparatus, method, and recording medium" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,071, issued on May 12, was assigned to ADVANTEST Corp. (Tokyo).

"Electromagnetic wave measuring apparatus, method, and recording medium" was invented by Takao Sakurai (Miyagi, Japan), Nobutaka Takahashi (Miyagi, Japan) and Yoshinori Kikuchi (Saitama, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electromagnetic wave measuring apparatus irradiates an irradiation target having a measuring target with a pre-irradiation electromagnetic wave and, based on a post-irradiation electromagnetic wave obtained, measures the measuring target. The post-irradiation electromagnetic wave has a response component from the measuring target and a background co...