US Patent Issued to ADVANTEST on May 12 for "Automatic test equipment" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,178, issued on May 12, was assigned to ADVANTEST Corp. (Tokyo).

"Automatic test equipment" was invented by Hiroki Ichikawa (Tokyo) and Tasuku Fujibe (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An interface device is provided between a test head and a device under test (DUT). A socket board includes sockets each configured to mount a DUT, and a socket PCB having a first face that mounts the sockets and a second face provided with multiple back face electrodes. An interposer has a first face provided with multiple deformable electrodes and a second face provided with multiple non-deformable electrodes and is configured such that the multiple ...