US Patent Issued to ADVANTEST on June 30 for "Detection method, system, electronic equipment, and storage medium of product test data" (Japanese Inventor)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,306, issued on June 30, was assigned to ADVANTEST Corp. (Tokyo).

"Detection method, system, electronic equipment, and storage medium of product test data" was invented by Kun Xu (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention discloses a detection method, a system, an electronic equipment, and a storage medium of product test data, where the detection method includes: obtaining historical test data of historical batches of products; screening the historical test data to obtain intermediate test data; grouping the intermediate test data based on preset test parameters to obtain first groups; obtaining distribution patterns...