US Patent Issued to Advantest on Aug. 4 for "Methods and devices for testing a device under test using test site specific thermal control signaling" (German Inventors)

ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,699,128, issued on Aug. 4, was assigned to Advantest Corp. (Tokyo).

"Methods and devices for testing a device under test using test site specific thermal control signaling" was invented by Matthias Werner (Bibertal, Germany) and Martin Fischer (Heilbronn, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments of the present invention provide an automated test equipment (a "tester") for testing a device under test, including a bidirectional dedicated real-time handler interface. Some embodiments include an interface having a trigger function, a fixed endpoint interface, an interface arranged on a test head, and/or a number of lines/communicati...