ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,724,062, issued on Sept. 1, was assigned to Advanced Micro Devices Inc. (Santa Clara, Calif.).
"Laser perturbation probing" was invented by Ravikumar Venkat Krishnan (Singapore), Gopinath Ranganathan (Singapore) and Jiann Min Chin (Singapore).
According to the abstract* released by the U.S. Patent & Trademark Office: "The disclosed method includes waveform extractions from a cross-talking environment by measuring a signal from a target circuit/transistor while deterministically stimulating a second circuit using a second laser and post-processing. The method includes analyzing the measured signal detecting a fault or an error in one of the circuits based on the analysis. Various othe...