US Patent Issued to Advanced Micro Devices on April 7 for "Defect tracking within a computing environment" (American, Indian Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,603, issued on April 7, was assigned to Advanced Micro Devices Inc. (Santa Clara, Calif.).

"Defect tracking within a computing environment" was invented by Vilas Sridharan (Boston), Jeffrey William Kellington (Austin, Texas), Naveen Krishna Chatradhi (Bangalore, India) and Sivakumar Sathappan (Bangalore, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "Defect tracking within a computing environment includes storing a retired page table within a read only memory (ROM) of a computing node. A hardware processor of the computing node detects one or more System-on-Chips (SoCs) within the computing node. The hardware processor reads the retired page t...