US Patent Issued to Abberior Instruments on Feb. 24 for "Method and light microscope for localizing individual emitters in a sample" (German Inventors)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,560,791, issued on Feb. 24, was assigned to Abberior Instruments GmbH (Goettingen, Germany).

"Method and light microscope for localizing individual emitters in a sample" was invented by Roman Schmidt (Goettingen, Germany) and Andreas Schoenle (Goettingen, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for localizing individual emitters in a sample with a first localization step and a second localization step with an increased accuracy including illuminating the emitter with an intensity distribution of the illumination light having a local minimum at illumination positions arranged around the location of the emitter determined in the fi...