US Patent Issued to ABB Schweiz on Sept. 22 for "Outlier detection based on process fingerprints from robot cycle data" (German, Spanish Inventors)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,661, issued on Sept. 22, was assigned to ABB Schweiz AG (Baden, Switzerland).

"Outlier detection based on process fingerprints from robot cycle data" was invented by Arzam Muzaffar Kotriwala (Ladenburg, Germany), Benjamin Kloepper (Mannheim, Germany), Ido Amihai (Heppenheim, Germany), Taisuke Minagawa (Barcelona, Spain), Dominik Olschewski (Frankfurt am Main, Germany) and Kai Merz (Wollstadt, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system and method for outlier detection based on process fingerprints from robot cycle data includes a data collection component, which is configured to collect cyclic data, wherein the cyclic data compr...