ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,578, issued on Sept. 15, was assigned to ABB SCHWEIZ AG (Baden, Switzerland).

"Diagnosis and prognosis of IGBT modules" was invented by Aleksi Vulli (Helsinki), Gerd Schlottig (Uitikon Waldegg, Switzerland), Enea Bianda (Baden, Switzerland), Michal Orkisz (Cracow, Poland) and Marcin Firla (Cracow, Poland).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus for performing the following. The apparatus maintains, in a memory, information on a computational model for thermal behavior of layers of an insulated-gate bipolar transistor, IGBT, module. The apparatus obtains measurements of the dissipated power at the semiconductors and the ambient te...