US Patent Issued to ABB Schweiz on April 21 for "Method and apparatus for monitoring machine learning models" (German, Canadian Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,972, issued on April 21, was assigned to ABB Schweiz AG (Baden, Switzerland).

"Method and apparatus for monitoring machine learning models" was invented by Benedikt Schmidt (Heidelberg, Germany), Ido Amihai (Heppenheim, Germany), Moncef Chioua (Montreal), Arzam Kotriwala (Ladenburg, Germany), Martin Hollender (Dossenheim, Germany), Dennis Janka (Heidelberg, Germany), Felix Lenders (Darmstadt, Germany), Jan Christoph Schlake (Darmstadt, Germany), Benjamin Kloepper (Mannheim, Germany) and Hadil Abukwaik (Weinheim, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method includes training a first control model by utilizing a first set of input ...