ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,870, issued on Sept. 1.
"Shape measurement device and shape measurement method" was invented by Yoshito Hashimura (Amagasaki-shi, Jamaica), Shyoji Fujiwara (Amagasaki, Japan) and Nobuki Fujiwara (Amagasaki, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A first point measurement control part rotates a cylinder part of a cylindrical rotation part to a predetermined reference cylindrical angle, makes the laser beam irradiate, and measures a position of a predetermined first point in a hollow from a reflection point of the laser beam on the mirror. A first rotation control part rotates the cylinder part from the reference cylindrical angle to 180...