US Patent Issued on Oct. 6 for "Test device, method, and system for treating Alzheimer's disease" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,752,127, issued on Oct. 6.

"Test device, method, and system for treating Alzheimer's disease" was invented by Weidong Le (Dalian, China), Song Li (Dalian, China), Jun Zhang (Dalian, China), Congcong Jia (Dalian, China), Yixin Chen (Dalian, China), Hongbin Ding (Dalian, China) and Yarui Zhao (Dalian, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test device, a test method, and a test system for treating AD are provided. The test device for AD includes: a THz wave generator, used for generating THz wave; a headgear, connected to the THz wave generator via an optical fiber, is utilized for precise irradiation of the THz wave to a specific brain reg...