ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,035, issued on Oct. 27.
"Circuits and methods for precise capacitance measurement" was invented by Yaoguo Zhang (Ningbo, China), Bo Xia (Ningbo, China), Bo Nie (Ningbo, China) and Yulin Zhang (Ningbo, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention relates to the microelectronics domain, specifically to a capacitance measurement circuit and method designed to enhance precision in capacitance measurements. The circuit comprises a capacitor under test, which is connected at one end to the output of an excitation circuit and at the other end to the input of an adjustment circuit. It includes a first timing switch circuit conn...