ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,876, issued on Oct. 20.
"Load pull tuner with integrated on-wafer planarity control" was invented by Christos Tsironis (Kirkland, Canada).
According to the abstract* released by the U.S. Patent & Trademark Office: "Planarity adjustment of RF microprobes in a load pull setup on wafer, using a low-profile impedance tuner that is mounted on a 3-axis tuner positioner under an angle matching the angle of the wafer probe is performed using a separation of the tuning module from the tuner housing and allowing it to rotate around an axis through the tips of the wafer microprobe. This renders the directly connected tuner autonomous and compatible with all existing probe stations."
The pa...