ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,291, issued on Nov. 3.
"Defect inspection system using 3D measuring machine" was invented by Young Han Lim (Seoul, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed herein is a defect inspection system using a three-dimensional (3D) measuring machine, which may include a conveying part disposed between a loading part and an unloading part and configured to hold and transfer a device, a 2D measuring machine provided to face the conveying part and configured to generate a 2D image of the device, a 3D measuring machine provided to face the conveying part in a row with the 2D measuring machine and configured to generate a 3D image of t...