ALEXANDRIA, Va., March 31 -- United States Patent no. 12,592,356, issued on March 31.
"Sample holder and impedance microscope" was invented by Toshihiko Ogura (Tsukuba, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A sample holder for an impedance microscope according to an aspect includes: a first insulating film having a front surface and a back surface; a second insulating film having a front surface facing the back surface of the first insulating film and a back surface; a conductive film disposed on the front surface of the first insulating film; an electrode disposed to face the back surface of the second insulating film; and a conductive member fixed at a ground potential or a constant potentia...