ALEXANDRIA, Va., March 31 -- United States Patent no. 12,590,895, issued on March 31.

"Method for measuring fluorescent decay in phosphors" was invented by William A. Hollerman (Lafayette, La.), John Miller (Lafayette, La.), Tolga Karsili (Lafayette, La.) and Stephen W. Allison (Lafayette, La.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed herein is a methodology which quickly provides for the analysis of multiple luminescence decays from individual phosphor samples. The disclosed method utilizes a Trust-Region method to provide non-physical solutions when the fitting application was not provided with bounds for the respective intensities and decay times. Results from Double Decay were found to be ...