US Patent Issued on June 30 for "Method for testing an OCT device and test object" (German Inventor)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,322, issued on June 30.

"Method for testing an OCT device and test object" was invented by Eva Lankenau (Langstedt, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for testing an OCT device (14), in which a first test object (27) is arranged in an OCT beam path (16) of an OCT device (14). The first test object (27) comprises a layered structure (29) made up of a plurality of transparent layers and an entry body (30). OCT light emitted by the OCT device (14) enters the entry body (30) via an entry surface and propagates through the entry body (30) up to the layered structure (29). An entry surface of the entry body (30) is shaped as a...