US Patent Issued on June 23 for "System and method for diffraction-based structure determination with simultaneous processing modules" (American, French Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,389, issued on June 23.

"System and method for diffraction-based structure determination with simultaneous processing modules" was invented by Luc Bourhis (Antony, France), Jorg Karcher (Madison, Wis.) and Michael Ruf (Madison, Wis.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A diffraction system for determining a crystalline structure of a sample collects a series of diffraction frames from a crystal sample illuminated by a beam of photonic or particulate radiation, such as X-rays. A plurality of software modules for processing the detected diffraction frames perform different tasks in refining the collected diffraction data, such as harvesting,...