ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,322, issued on July 28.
"Universal tuner for on wafer load pull" was invented by Christos Tsironis (Kirkland, Canada).
According to the abstract* released by the U.S. Patent & Trademark Office: "A universal load pull tuner for on wafer load pull and noise measurements is connected directly to the wafer-probe to minimize insertion loss and maximize the tuning range; it incorporates a suspended tuning module and an automated anti-tilting balancing mechanism with manual wafer tip planarization capability, all in a solid housing. The tuning module includes up to three mobile carriages and wideband tuning probes controlling independently impedances for up to three harmonic frequencies...