US Patent Issued on July 28 for "Infrared leak detector" (Chinese Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. D1,136,966, issued on July 28.

"Infrared leak detector" was invented by Hao Chen (Xuzhou, China), Weilong Li (Xuzhou, China) and Yiqi Qiu (Xuzhou, China).

The patent was filed on March 20, 2025, under Application No. D/525,226.

*For further information, including images, charts and tables, please visit: http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2=HITOFF&p=1&u=%2Fnetahtml%2FPTO%2Fsearch-bool.html&r=1&f=G&l=50&co1=AND&d=PTXT&s1=D1136966&OS=D1136966&RS=D1136966

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