ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,079, issued on July 14.
"Planarity control for load pull tuner on wafer" was invented by Christos Tsironis (Kirkland, Canada).
According to the abstract* released by the U.S. Patent & Trademark Office: "Planarity adjustment of RF microprobes in a load pull setup on wafer, using a low-profile impedance tuner that is mounted on a 3-axis tuner positioner under an angle matching the angle of the wafer probe. is performed using a swivel or a gimbal connecting the vertical axis of the 3-axis tuner positioner with the tuner body. A swivel is used when there is a single geometrical axis between the RF microprobe tips and the tuner slabline. If the axis of the slabline is not aligned with...