ALEXANDRIA, Va., April 7 -- United States Patent no. 12,598,495, issued on April 7.
"Techniques for panel-specific CLI measurement" was invented by Tianyang Bai (Somerville, N.J.), Yan Zhou (San Diego), Qian Zhang (Basking Ridge, N.J.), Junyi Li (Fairless Hills, Pa.) and Tao Luo (San Diego).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for wireless communications are described. A first user equipment (UE) may receive control signaling identifying a set of antenna panels of the first UE usable for measuring crosslink interference (CLI) experienced within a set of CLI resources. The first UE may perform CLI measurements on signals received from a second UE via the set of CLI resou...