US Patent Issued on April 7 for "Signal quality measurements for identifying intelligent reflection surfaces" (California, New York, New Jersey, Pennsylvania Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,598,494, issued on April 7.

"Signal quality measurements for identifying intelligent reflection surfaces" was invented by Mehmet Izzet Gurelli (San Diego), Qiang Wu (San Diego), Junyi Li (Fairless Hills, Pa.), Raju Hormis (New York), Tao Luo (San Diego), Navid Abedini (Basking Ridge, N.J.), Ozge Koymen (Princeton, N.J.), Farideddin Fayazbakhsh (Chatham, N.J.) and Iyab Issam Sakhnini (San Diego).

According to the abstract* released by the U.S. Patent & Trademark Office: "Various aspects of the present disclosure generally relate to wireless communication. In some aspects, a network node may transmit, via a beam and via a first subset of intelligent reflection surfaces (IRSs), a first ...