GENEVA, March 24 -- TOPOLOGIC INC. (7-3-1, Hongo, Bunkyo-ku, Tokyo1138485), ＴｏｐｏＬｏｇｉｃ株式会社 (東京都文京区本郷七丁目３番１号) filed a patent application (PCT/JP2025/032028) for "HEAT FLUX MEASUREMENT SYSTEM AND HEAT FLUX MEASUREMENT METHOD" on Sep 10, 2025. With publication no. WO/2026/058906, the details related to the patent application was published on Mar 19, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): TAKAHA...