INTERNATIONAL PATENT: TOPCON CORPORATION, 株式会社トプコン FILES APPLICATION FOR "OPHTHALMIC EXAMINATION DEVICE AND OPHTHALMIC EXAMINATION METHOD"

GENEVA, March 3 -- TOPCON CORPORATION (75-1, Hasunuma-cho, Itabashi-ku, Tokyo1748580), 株式会社トプコン (東京都板橋区蓮沼町７５番１号) filed a patent application (PCT/JP2025/009112) for "OPHTHALMIC EXAMINATION DEVICE AND OPHTHALMIC EXAMINATION METHOD" on Mar 11, 2025. With publication no. WO/2026/042315, the details related to the patent application was published on Feb 26, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): NORO Ryoka (c/o TOPCON CORPORATION, 75-1,...