GENEVA, May 11 -- TOKYO SEIMITSU CO., LTD. (2968-2, Ishikawa-machi, Hachioji-shi, Tokyo1928515), 株式会社東京精密 (東京都八王子市石川町２９６８－２) filed a patent application (PCT/JP2025/036635) for "CONTROL DEVICE FOR MEASUREMENT APPARATUS, MEASUREMENT APPARATUS, AND CONTROL METHOD FOR MEASUREMENT APPARATUS" on Oct 17, 2025. With publication no. WO/2026/094661, the details related to the patent application was published on May 07, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Orga...