INTERNATIONAL PATENT: TOKYO ELECTRON LIMITED, 東京エレクトロン株式会社 FILES APPLICATION FOR "PARTICLE MEASUREMENT DEVICE, PARTICLE MEASUREMENT SYSTEM AND PARTICLE MEASUREMENT METHOD"

GENEVA, March 30 -- TOKYO ELECTRON LIMITED (3-1, Akasaka 5-chome, Minato-ku, Tokyo1076325), 東京エレクトロン株式会社 (東京都港区赤坂五丁目３番１号) filed a patent application (PCT/JP2025/031562) for "PARTICLE MEASUREMENT DEVICE, PARTICLE MEASUREMENT SYSTEM, AND PARTICLE MEASUREMENT METHOD" on Sep 08, 2025. With publication no. WO/2026/063249, the details related to the patent application was published on Mar 26, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization ...