INTERNATIONAL PATENT: TOKYO ELECTRON LIMITED, 東京エレクトロン株式会社 FILES APPLICATION FOR "MEASUREMENT METHOD, MEASUREMENT SYSTEM AND INSPECTION DEVICE"

GENEVA, March 17 -- TOKYO ELECTRON LIMITED (3-1, Akasaka 5-chome, Minato-ku, Tokyo1076325), 東京エレクトロン株式会社 (東京都港区赤坂五丁目３番１号) filed a patent application (PCT/JP2025/029802) for "MEASUREMENT METHOD, MEASUREMENT SYSTEM, AND INSPECTION DEVICE" on Aug 25, 2025. With publication no. WO/2026/053785, the details related to the patent application was published on Mar 12, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): RAJEND...