International Patent: SYSTEMS AND METHODS FOR MONITORING ON-THE-FLY (OTF) WELDING USING OPTICAL COHERENCE TOMOGRAPHY (OCT)

GENEVA, Nov. 6 -- IPG PHOTONICS CORPORATION filed a patent application (US2025/048712) for “SYSTEMS AND METHODS FOR MONITORING ON-THE-FLY (OTF) WELDING USING OPTICAL COHERENCE TOMOGRAPHY (OCT)”. With publication no. WO/2026/080258, here are the other details related to the patent application:

Kind: Corrected version of pamphlet [A9]

IPC: B23K 26/03

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Disclaimer: Curated by HT Syndication....