GENEVA, June 24 -- E-INFOCHIPS PRIVATE LIMITED filed a patent application (IN2025/050674) for “SYSTEM AND METHOD FOR DETECTING DEFORMITY IN AN OBJECT USING 3D IMAGE”. With publication no. WO/2026/115556, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: G06T 7/73
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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