INTERNATIONAL PATENT: SONY SEMICONDUCTOR SOLUTIONS CORPORATION, ソニーセミコンダクタソリューションズ株式会社 FILES APPLICATION FOR "DEFECT DETECTION DEVICE AND DISTANCE MEASUREMENT DEVICE"

GENEVA, May 5 -- SONY SEMICONDUCTOR SOLUTIONS CORPORATION (4-14-1 Asahicho, Atsugi-shi, Kanagawa2430014), ソニーセミコンダクタソリューションズ株式会社 (神奈川県厚木市旭町四丁目１４番１号) filed a patent application (PCT/JP2025/036618) for "DEFECT DETECTION DEVICE AND DISTANCE MEASUREMENT DEVICE" on Oct 17, 2025. With publication no. WO/2026/088880, the details related to the patent application was published on Apr 30, 2026.

Notably, the patent application was submitted under the International Patent Classifica...