INTERNATIONAL PATENT: SKYVERSE TECHNOLOGY CO., LTD., 深圳中科飞测科技股份有限公司 FILES APPLICATION FOR "WAFER DEFECT DETECTION APPARATUS AND METHOD"

GENEVA, March 23 -- SKYVERSE TECHNOLOGY CO., LTD. (101, 102, No. 1301-14, Guanguang Road, Xinlan Community, Guanlan Street, Longhua DistrictShenzhen, Guangdong 518000), 深圳中科飞测科技股份有限公司 (中国广东省深圳市龙华区观澜街道新澜社区观光路1301-14号101、102) filed a patent application (PCT/CN2025/129270) for "WAFER DEFECT DETECTION APPARATUS AND METHOD" on Oct 22, 2025. With publication no. WO/2026/057094, the details related to the patent application was published on Mar 19, 2026.

Notably, the patent application...