INTERNATIONAL PATENT: SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY CHINESE ACADEMY OF SCIENCES, 中国科学院上海微系统与信息技术研究所 FILES APPLICATION FOR "FOCAL-LENGTH MEASUREMENT DEVICE AND METHOD FOR COMMON-FOCAL-PLANE MULTI-FOCAL LENS"

GENEVA, April 17 -- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY CHINESE ACADEMY OF SCIENCES (865 Changning RoadChangning District, Shanghai 200050), 中国科学院上海微系统与信息技术研究所 (中国上海市长宁区长宁路865号) filed a patent application (PCT/CN2024/136034) for "FOCAL-LENGTH MEASUREMENT DEVICE AND METHOD FOR COMMON-FOCAL-PLANE MULTI-FOCAL LENS" on Dec 02, 2024. With publication no. WO/2026/076803, the details related to the patent application was published on Apr 16, 2026.

Notably, the patent application was submitted under the International...