International Patent: SCANNING ELECTRON MICROSCOPE AND METHODS FOR EVALUATING PROPERTIES OF A SAMPLE THEREWITH

GENEVA, Aug. 31 -- APPLIED MATERIALS ISRAEL LTD. filed a patent application (IL2025/050866) for “SCANNING ELECTRON MICROSCOPE AND METHODS FOR EVALUATING PROPERTIES OF A SAMPLE THEREWITH”. With publication no. WO/2026/176424, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: H01J 37/28

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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