INTERNATIONAL PATENT: SANDISK TECHNOLOGIES, INC. FILES APPLICATION FOR "READ RETRY WITH PHYSICAL DEFECT JUDGEMENT"

GENEVA, May 12 -- SANDISK TECHNOLOGIES, INC. (951 Sandisk DriveMilpitas, California 95035) filed a patent application (PCT/US2025/026930) for "READ RETRY WITH PHYSICAL DEFECT JUDGEMENT" on Apr 29, 2025. With publication no. WO/2026/095987, the details related to the patent application was published on May 07, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): TIAN, Xuan (c/o Sandisk Technologies, Inc.951 Sandisk DriveMilpitas, California 95035), LI, Liang (c/o Sandisk Technologies, Inc.951 Sandisk DriveMilpitas, California 95035), WANG, Ming (c/o Sandisk Technologies, Inc.951 Sandisk DriveMilpi...