INTERNATIONAL PATENT: RENSSELAER POLYTECHNIC INSTITUTE FILES APPLICATION FOR "MICROFABRICATED TOPOLOGY PLATFORM AND IMAGE ANALYSIS SYSTEM FOR DETERMINING CELL CHIRALITY"

GENEVA, May 6 -- RENSSELAER POLYTECHNIC INSTITUTE (110 8th StreetJ BuildingTroy, New York 12180) filed a patent application (PCT/US2025/052241) for "MICROFABRICATED TOPOLOGY PLATFORM AND IMAGE ANALYSIS SYSTEM FOR DETERMINING CELL CHIRALITY" on Oct 23, 2025. With publication no. WO/2026/090402, the details related to the patent application was published on Apr 30, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): WAN, Qun (9 Champagne CourtWatervliet, New York 12189), XU, Liyao (51 25th StreetTroy, New York 12180), PETERS, Frank (26 Arbor CourtHolmes, New York 12531), RAMAR, Thangam (2410 21st ...