INTERNATIONAL PATENT: RAINTREE SCIENTIFIC INSTRUMENTS (SHANGHAI) CORPORATION, 睿励科学仪器（上海）有限公司 FILES APPLICATION FOR "METHOD AND SYSTEM FOR PROCESSING BACKSIDE IMAGE OF DICED WAFER AND STORAGE MEDIUM"

Posted On: 2026-03-08

GENEVA, March 8 -- RAINTREE SCIENTIFIC INSTRUMENTS (SHANGHAI) CORPORATION (6 Blog, No. 68 Huatuo Rd., China (Shanghai) Pilot Free Trade ZonePudong New Area, Shanghai 201203), 睿励科学仪器（上海）有限公司 (中国上海市浦东新区中国（上海）自由贸易试验区华佗路68号6幢) filed a patent application (PCT/CN2024/115810) for "METHOD AND SYSTEM FOR PROCESSING BACKSIDE IMAGE OF DICED WAFER, AND STORAGE MEDIUM" on Aug 30, 2024. With publication no. WO/2026/044670, the details related to the patent application was ...

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INTERNATIONAL PATENT: RAINTREE SCIENTIFIC INSTRUMENTS (SHANGHAI) CORPORATION, 睿励科学仪器（上海）有限公司 FILES APPLICATION FOR "METHOD AND SYSTEM FOR PROCESSING BACKSIDE IMAGE OF DICED WAFER AND STORAGE MEDIUM"