INTERNATIONAL PATENT: QRT CO., LTD., 큐알티 주식회사 FILES APPLICATION FOR "METHOD FOR EVALUATING RADIATION RESISTANCE OF SEMICONDUCTOR DEVICE UNDER TEST USING HEAVY IONS AND PULSED LASER"

GENEVA, May 12 -- QRT CO., LTD. (2091 Gyeongchung-daero, Bubal-eupIcheon-siGyeonggi-do 17336), 큐알티 주식회사 (경기도이천시부발읍 경충대로 2091) filed a patent application (PCT/KR2025/017553) for "METHOD FOR EVALUATING RADIATION RESISTANCE OF SEMICONDUCTOR DEVICE UNDER TEST USING HEAVY IONS AND PULSED LASER" on Oct 30, 2025. With publication no. WO/2026/095665, the details related to the patent application was published on May 07, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Invento...