GENEVA, Oct. 5 -- TOKYO SEIMITSU CO., LTD. filed a patent application (JP2026/003677) for “PROBER AND WAFER TEST SYSTEM”. With publication no. WO/2026/203819, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: H10P 74/00
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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