International Patent: PROBE PIN FOR INSPECTING ELECTRICAL CHARACTERISTICS, PROBE CARD, AND MANUFACTURING METHOD THEREFOR

GENEVA, July 1 -- SWCC CORPORATION filed a patent application (JP2024/043603) for “PROBE PIN FOR INSPECTING ELECTRICAL CHARACTERISTICS, PROBE CARD, AND MANUFACTURING METHOD THEREFOR”. With publication no. WO/2026/126330, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01R 1/06

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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