INTERNATIONAL PATENT: PEKING UNIVERSITY, 北京大学 FILES APPLICATION FOR "OXIDE SEMICONDUCTOR 2 T0C DRAM NON-VOLATILE POWER-OFF TESTING CIRCUIT AND VERIFICATION METHOD"

GENEVA, March 1 -- PEKING UNIVERSITY (No. 5 Yiheyuan RoadHaidian District, Beijing 100871), 北京大学 (中国北京市海淀区颐和园路5号) filed a patent application (PCT/CN2024/118124) for "OXIDE SEMICONDUCTOR 2 T0C DRAM NON-VOLATILE POWER-OFF TESTING CIRCUIT AND VERIFICATION METHOD" on Sep 11, 2024. With publication no. WO/2026/040139, the details related to the patent application was published on Feb 26, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): WU, Yanqing (School Of Integrated Circuits, P...