GENEVA, Feb. 23 -- ORBOTECH LTD. (Shderot Hasanhedrin 78110101 Yavne) filed a patent application (PCT/IB2025/057842) for "THERMAL DETECTION OF INTERNAL DEFECTS IN SEMICONDUCTOR" on Aug 01, 2025. With publication no. WO/2026/038098, the details related to the patent application was published on Feb 19, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): PORAT, Elkana (Simtat HeCharuv 9,7658849 Rehovot), YOGEV, Ronen (Hulda 3377648200 Hulda), TURKO, Nir (Prof. Birk 47639302 Rehovot), SAKAEV, Igor (Shimon 258902368 Arad), PASKOVER, Yuri (32A Seora Street30560 Binyamina)
Abstract: Infrared radiatio...