GENEVA, April 6 -- ORBOTECH LTD (Shderot Hasanhedrin 78110101 Yavne) filed a patent application (PCT/IB2025/058786) for "HOLOGRAPHIC INSPECTION METHOD AND SYSTEM" on Sep 01, 2025. With publication no. WO/2026/069041, the details related to the patent application was published on Apr 02, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): PORAT, Elkana (Simtat HeCharuv 97658849 Rehovot), TURKO, Nir (Prof. Yehudit Birk 47608640 Rehovot), LINDEN, John (Yahalom 10/47173728 Modiin)
Abstract: The system includes a light source that emits partially coherent or coherent light split into a reference bea...