International Patent: OPTICAL CHARACTERISTIC MEASUREMENT METHOD, OPTICAL CHARACTERISTIC MEASUREMENT PROGRAM, AND SUBJECTIVE OPTOMETRY DEVICE

GENEVA, Oct. 5 -- NIDEK CO., LTD. filed a patent application (JP2026/006572) for “OPTICAL CHARACTERISTIC MEASUREMENT METHOD, OPTICAL CHARACTERISTIC MEASUREMENT PROGRAM, AND SUBJECTIVE OPTOMETRY DEVICE”. With publication no. WO/2026/204029, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: A61B 3/036

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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